Electronics laboratory

Microelectronics technology

Research activity description


You can see something from the list following by clicking on the appropriate word each time:

Back to Lab Page
Reliability studies of on-chip multilevel interconnections, focuses on the experimental study of electromigration effects on multilevel on-chip Al/Ti metalizations under pulsed current conditions at 100 Mbits/s and the subsequent statistical analysis and reliability prognosis.

Modelling of high bit rate on-chip interconnections, aiming to push the silicon bipolar technology into the deep submicron range and to develop design expertise and CAD activities in the field of digital and mixed analogue-digital applications.

Modelling of high-bit rate multi-chip interconnection; the objective of this work is to derive through electrical modelling design tools for high-density off-chip interconnect technology compatible with high-speed ICs.

Development of metal-oxide based sensors, concerns with the development of advanced thin and thick film deposition techniques for metal-oxides for the fabrication of passive and active gas sensors.

Development of hybrid microcircuits for telecommunications; the project aims at the hybridization of telecommunications electronic subsystems and the development of high power packaging techniques and reliability studies.

You can see something from the list following by clicking on the appropriate word each time:


Back to Lab Page